Wafer Level Automatic In-plane Magnetic Field Probe Station

Wafer Level Automatic In-plane Magnetic Field Probe Station

1.The DX1PS3 is a wafer-level automated in-plane magnetic field probe stage.
2.It is designed for accurate in-plane magnetic field measurements and probe testing at the wafer level.
3.It supports testing of 12-inch wafers (compatible with 8-inch and 6-inch chips).
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Description

I. Products Overview

  • The DX1PS3 is a wafer-level automated in-plane magnetic field probe stage.
  • It is designed for accurate in-plane magnetic field measurements and probe testing at the wafer level.
  • It supports testing of 12-inch wafers (compatible with 8-inch and 6-inch chips).

 

II. Core features

  • Magnetic field direction: in-plane magnetic field.
  • Magnetic field strength: In-plane magnetic field strength over 330mT.
  • Probe type and number: supports 4 sets of DC probes or microwave probes.
  • Sample stage parameters: XY electronically controlled travel ±150mm, adjustment accuracy 2um; T-axis manual adjustment ±5°, minimum adjustment accuracy 5°.
  • Real-time monitoring: real-time monitoring of magnetic field strength, monitoring accuracy better than 1%, magnetic field resolution better than 0.02mT.
  • Z-axis probe platform: provide fast lifting function to improve testing efficiency.

Detailed parameter introduction

Model DX1PS3
Magnetic field direction In-plane
Magnetic field strength In-plane magnetic field>330mT
Is the air gap adjustable No
Sample size 12-inch wafer (downward compatible with fragmentation test)
Probe type and quantity DC probes (set of 4) or microwave probes (set of 4)
Sample Stage Parameters XY electric control travel ±150mm, adjustment accuracy 2 um; T-axis manual adjustment ±5°, minimum adjustment accuracy 5°
Microscope type Monocular microscope
Product description ▹ In-plane/perpendicular magnetic field probe station, except for the magnet, the structural versatility design magnetic field uniformity is ±1%@d1mm;
▹ Real-time monitoring and feedback of magnetic field strength, the monitoring accuracy is better than 1%, and the magnetic field resolution is better than 0.02mT;
▹ Holds up to 12-inch wafers and is backward compatible with 8-inch and 6-inch chips;
▹ Compatible with up to 4 sets of probes (RF or DC test);
▹ Provide Z-axis probe platform rapid lifting function to achieve efficient testing.
Equipment can provide upgrade points The manual lifting function of the Z-axis probe platform can be upgraded to electric control

 

III. Application Fields

  • Applied to material characterization research, such as Hall effect measurement system, vibration sample magnetometer, etc.
  • Suitable for hard magnetic materials, soft magnetic materials, hard alloy measurement.
  • Can also be used for magneto-optical Kerr effect, magnetic field mapping, magnetic shielding and other functional materials measurement.

 

IV. Product Advantages

  • Flexible structure: Flexible structure design except for the magnet, magnetic field uniformity is ±1%@φ1mm.
  • High accuracy: real-time monitoring of magnetic field strength with accuracy better than 1% and resolution better than 0.02mT.
  • Strong compatibility: Supports multiple wafer sizes and probe types to meet a variety of testing needs.
  • Efficient Testing: Provides Z-axis probe platform fast lifting function to improve testing efficiency.

 

V. Deliver, Shipping and Serving

  • Specific delivery, shipping and servicing details are not directly mentioned on the website.
  • However, usually such products will include packaging, transportation to the designated location, installation instructions and after-sales service.
  • Customers may contact Dexinmag for specific delivery and service options.

 

 

FAQ

Q: What wafer sizes are supported by this product?

A: It supports 12-inch wafers and is compatible with 8-inch and 6-inch chips.

Q: What is the monitoring accuracy of magnetic field strength?

A: The monitoring accuracy is better than 1% and the magnetic field resolution is better than 0.02mT.

Q: Does it support the upgrade or replacement of probe type?

A: It supports upgrading from DC probe to microwave probe, or replacing other types of probes according to requirements.

Q: What about after-sales service?

A: Customers can contact Dexinmag for professional after-sales service support, including technical consulting and maintenance.

Q: Are there any customized services?

A: Dexinmag provides customized service, customers can make requests according to specific needs and get professional design solutions.

Q: How to get the product quotation?

A: Customers can get product quotes through the "Get A Quote!" button on the website or contact customer service.

 

 

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