Magnetic Field Probe Station

 

This cryogenic probe station (optional: high temperature, low temperature, vacuum, magnetic field) is a high-precision, multi-functional experimental platform designed for testing the electrical and magnetic properties of semiconductor materials, micro-nano devices, magnetic materials, spintronic devices and related technical fields.

 

 

1. High-precision experimental platform: The probe station has a probe arm with high-precision displacement, which can accurately operate and test tiny samples.

2. Multi-function configuration: According to user needs, high temperature, low temperature, vacuum, magnetic field and other configurations can be selected to meet the needs of various complex experimental environments.

3. High-stability magnetic field: Through a carefully designed magnetic field system combined with a high-precision bipolar constant current power supply, the high stability of the magnetic field is ensured.

4. Displacement stage design: The displacement stage is equipped with a magnetic fluid seal to achieve two-dimensional movement and 360-degree rotation of the sample stage in the horizontal direction, and the operation is flexible and convenient.

5. Microscopic observation: Equipped with a high-precision electron microscope, it is convenient for users to observe and operate tiny samples in detail.

 

 

This probe station is widely used in the fields of semiconductor industry, micro-electromechanical systems, superconductivity, electronics, ferroelectronics, physics, materials science and biomedicine, including but not limited to:

   Magnetic performance test

   Microwave performance test

   DC, RF performance test

   MEMS performance test

   Superconducting performance test

   Photoelectric performance test of nanocircuits, quantum dots and wires

   Chip test in high and low temperature vacuum environment

   Material test

   Hall test

   Electromagnetic transport performance test, etc.

 

 

  In order to meet the needs of different users, we provide a series of optional accessories, including:

  Various DC probes, high-frequency probes, active probes

  Wired CCD or C-MOS video imaging device

  Suction cup motion device electromagnet system/superconducting magnet system

  1Mpa positive pressure system upgrade

  Ultra-high temperature upgrade option

  Ultra-high vacuum upgrade option

  Various probe fixtures

  Shielded box anti-vibration table

  Adapter

  Silent vacuum pump, etc.

 

 

High and low temperature vacuum magnetic field probe station
Model	DXTPS1	DXTPS2	DXTPS3
Vacuum degree	Maximum vacuum 10-8Pa
Cavity Material	Non-magnetic stainless steel or aluminum alloy
Magnetic Field Range	2000Gs @ 50mm	5000Gs @ 50mm	1T @ 50mm
Magnetic Field Direction	horizontal (can be designed according to user requirements in the vertical direction)
Power supply	Bipolar power supply ± 50A	Bipolar Power Supply ± 70A	Bipolar Power Supply ± 90A
Power supply stability	50ppm optional 10ppm
Refrigeration mode	Liquid helium/liquid nitrogen refrigeration/closed cycle refrigerator
Temperature Range	5 K-325K optional 500K
Temperature Range	65 K-325K optional 600K
Temperature Control Resolution	0.001K temperature controller related
Temperature stability	better than 0.1K depending on the temperature controller
Temperature sensor	silicon diode/PT 100
Sensors	One sample table, one radiation screen and one probe arm.
Sample table size (max)	Φ50mm, flatness ≤ u7m
Sample table fixing method	Vacuum Silicone Grease/Spring Presses
Sample table material	gold-plated oxygen-free copper
Microscope Travel	X, Y plane 2*2inch, accuracy 1um, Z axis travel ≥ 50.8mm
Magnification	16 ~ 100X/20 ~ 4000X
Vacuum chamber observation window size	1 inch	1.5 inch	2 inch
Window Materials	fused silica (optional K9, calcium fluoride, etc.)
Number of probe arms	2, 4, 6, 8 optional
Probe Arm Travel	25 mm-25mm-12mm replaceable
Mechanical accuracy	10um/ 2um/ 1um/ 0.7um
Interface form	Ordinary vacuum joint/three coaxial joint/BNC/ SMA, etc
Probe diameter	0.51mm
Needle tip diameter	10um/ 5um/ 1um optional
Probe material	Tungsten/GGB
Supply voltage	AC220V 50Hz/60Hz	AC380V 50Hz/60Hz

 

Parameter confirmation before purchase:

 

The maximum number of inches of wafers or devices that need to be tested; whether it is necessary to test fragments or single chips; the smallest single chip size;

How high is the mechanical precision requirement of the probe station;

The electrode size of spot measurement sample; 100μm*100μm or 60μm*60μm pad, or the mini pad made by FIB, or the metal circuit inside the ic;

A maximum of several probes are required for point measurement at the same time;

Whether the probe card test will be used;

How much is the minimum resolution of the optical microscope required;

In terms of microscopy, is it necessary to add a polarizer for LC liquid crystal hotspot detection;

Whether the current requirement reaches 100fa or below during the probe spot test! Does the low capacitance requirement need to be 0.1pf; Whether there is a radio frequency requirement;

What are the connected test instrument interfaces;

Whether heating or cooling is required when testing the environment! Whether a closed cavity is required;

What about Chuck's leakage requirements; Do you need to add a low-impedance chuck;

Whether an anti-shock table is required;

If you add a shockproof table, whether there is compressed air.

 

More pictures of the Cryogenic Probe Station

 

 

 

We deeply recognize the key role of logistics in enhancing the sense of shopping experience, so we are committed to designing the efficient, safe and reliable logistics and transportation networks tailored for you. We have established long -term and powerful partnerships with many well -known logistics providers to ensure that your products reach your destination in a timely and safe manner. In addition, we provide a comprehensive tracking service to allow you to understand the transportation status of the product. We give priority to customers, constantly strive to improve service quality, and strive to provide you with excellent shopping experience.

 

 

Question 1: What are the characteristics of high and low-temperature vacuum probes to micro-observation and imaging capabilities?

Answer:

1. High-resolution: The probe desk is equipped with a high-resolution microscope system that can observe the appearance and structure of the surface of the sample in real time. This is vital to the appearance characteristics, defect analysis and material representation of research devices.

2. Imaging capabilities: Microscope systems usually have a variety of imaging modes, such as optical imaging, electronic imaging, etc., to meet different samples and experimental needs. These imaging patterns can provide rich image information and help researchers understand the nature of the sample.

 

 

Question 2: What are the functions of data collection and analysis software in high and low-temperature vacuum probes?

Answer:

1. Real-time collection: The probe desk needs to be equipped with advanced data collection and analysis software to achieve real-time collection of electrical, micro and material analysis data.

2. Processing and analysis: Data collection software usually has multiple data processing and analysis functions, such as image processing, data fitting, and three-dimensional reconstruction.

 

 

Question 3: What are the characteristics of high- and low-temperature vacuum probes in terms of micro-observation and imaging capabilities?

Answer:

High-resolution: The probe desk is equipped with a high-resolution microscope system that can observe the appearance and structure of the surface of the sample in real time. This is vital to the appearance characteristics, defect analysis and material representation of research devices.

Imaging capabilities: Microscope systems usually have a variety of imaging modes, such as optical imaging, electronic imaging, etc., to meet different samples and experimental needs.