Hall Measurement System – DX-70 Series

The DX-70 Hall Measurement System is an advanced testing solution designed for precise characterization of semiconductor materials. Engineered for research labs and quality control environments, this system evaluates key electrical properties such as carrier concentration, Hall voltage, resistivity, and mobility-providing accurate data critical to semiconductor development.

Equipped with imported Keithley current and voltage sources, this system supports a wide test range, from ultra-low to high resistance materials like SiC, GaAs, graphene, and transparent conductive oxides. The integrated software automates the measurement process, delivering real-time results and data export options for further analysis.

Product introduction

DX-70 Hall Measurement System is used to measure important parameters such as carrier concentration, mobility, resistivity, and Hall coefficient of semiconductor materials. These parameters must be controlled in advance to understand the electrical properties of semiconductor materials. Therefore, the Hall effect test system is an important tool for understanding and researching semiconductor devices and the electrical properties of semiconductor materials.

DX-70 Hall Effect measurement system consists of an electromagnet, electromagnet power supply, high-precision constant current source, high-precision voltmeter, matrix card, Hall effect sample holder, standard sample, and system software.

This HMS system test uses the latest KEITHLEY imported test source meter, combined with the matching low-latency and high-bandwidth matrix card, which greatly improves the range and accuracy of the sample's power supply current and the test sample's Hall voltage. The wide current power supply and The wide voltage test range can cover most of the semiconductor devices on the market.

The experimental results are automatically calculated by the software, and parameters such as Bulk Carrier Concentration, Sheet Carrier Concentration, Mobility, Resistivity, Hall Coefficient, and Magnetoresistance can be obtained at the same time.

Parameters of DX-70 Hall measurement system

arameters	Carrier concentration	10³cm⁻³ - 10²³cm⁻³
	Mobility	0 .1 cm²/ voltsec - 10⁸cm²/ voltsec
	Resistivity range	10⁻⁷ Ohmcm - 10¹² Ohmcm
	Hall voltage	1 uV - 3V
	Hall coefficient	10⁻⁵ - 10²⁷cm³/ C
Testable material type	Semiconductor material	SiGe, SiC, InAs, InGaAs, InP,AlGaAs, HgCdTe and ferrite materials etc.
	low resistance material	Graphene, metals, transparent oxides, weakly magnetic semiconductor materials, TMR materials, etc.
	high resistance material	Semi-insulating GaAs, GaN, CdTe, etc.
	Material Conductive Particles	Type P and Type N testing of materials
Magnetic field environment	Magnet Type	Variable electromagnet
	Magnitude of magnetic field	1070mT (The pole pitch is 10mm) 687mT (The pole pitch is 20mm) 500mT (The pole pitch is 30mm) 378mT (The pole pitch is 40mm) 293mT (The pole pitch is 50mm)
	Uniform area	1%
	Optional magnetic environment	The electromagnet of relevant magnetic size can be customized according to the needs of customers
Electrical parameters	Current source	±0.1nA- ±1000mA
	Current source resolution	0.001uA
	Measuring voltage	±10nV ~ ±200V
	Voltage measurement resolution	0.0001 mV
Other Accessories	Shading	Extern ally installed light-shielding parts to make the test material more stable
	Sample size	Maximum 30mm * 30mm
	Box cabinet	6006001000mm
	Test piece	Hall effect of Institute of Semiconductors, Chinese Academy of Sciences Standard test samples and data: 1 set (Si, Ge, GaAs, lnSb)
	Making ohmic contacts	Electric soldering iron, indium chip, solder, enameled wire, etc.
One-button automatic measurement can be performed without the need for human operation after the test is started
The software can perform I-V curve and BV curve
Set in software for automatic temperature measurement
The experimental results are measured, and the data will be temporarily saved in the software. If long-term storage is required, the data can be exported to an EXCEL table to facilitate later data processing.
Provide the Hall effect standard test samples and data of the Institute of Semiconductors, Chinese Academy of Sciences: 1 set

Testable samples of the HMS system

tastable samples of HEMS

FAQ

Q: What is the Hall Effect Testing System used for?

A: The Hall Effect Testing System is used to measure the electrical properties of semiconductor materials, including carrier concentration, mobility, resistivity, and Hall coefficient.

Q: How does the Hall Effect Testing System work?

A: The system applies a magnetic field perpendicular to the current flow in a semiconductor sample. The resulting Hall voltage is measured, from which various electrical properties can be determined.

Q: What are the components of the Hall Effect Testing System?

A: The system includes components such as electromagnets, power supplies, constant current sources, voltmeters, sample holders, standard samples, and specialized software.

Q: Can the Hall Effect Testing System provide standard samples and test reports?

A: Yes, the system can provide standard samples for calibration and testing purposes, along with detailed test reports for analysis.

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