Hall Effect Measurement Equipment – DX-100

Precision Testing for Semiconductor Materials

The DX-100 Hall Effect Measurement Equipment is a high-performance system engineered for measuring critical electrical parameters of semiconductor materials. Equipped with a tunable electromagnet that can reach magnetic fields up to 2 Tesla, and supporting a wide temperature range of 80–500 K, this system is ideal for advanced research and industrial applications.

Key Features

Powerful Magnetic Field: Tunable electromagnet, max magnetic field of 2T.
Wide Temperature Range: Supports three temperature zones, from 80 K to 500 K.
Integrated Design: Streamlined setup and simplified operation.
One-Button Operation: Fully automatic measurement with software-driven control.

Parameters of DX-100 hall effect measurement equipment

Physical parameters	Carrier concentration	10³cm⁻³ - 10²³cm⁻³
	Mobility	0 .1 cm²/ voltsec - 10⁸cm²/ voltsec
	Resistivity range	10⁻⁷ Ohmcm - 10¹² Ohmcm
	Hall voltage	1 uV - 3V
	Hall coefficient	10⁻⁵ - 10²⁷cm³/ C
Testable material type	Semiconductor material	SiGe, SiC, InAs, InGaAs, InP,AlGaAs, HgCdTe and ferrite materials etc.
	low resistance material	Graphene, metals, transparent oxides, weakly magnetic semiconductor materials, TMR materials, etc.
	high resistance material	Semi-insulating GaAs, GaN, CdTe, etc.
	Material Conductive Particles	Type P and Type N testing of materials
Magnetic field environment	Magnet Type	Variable electromagnet
	Magnitude of magnetic field	1900mT (The pole pitch is 10mm) 1300mT (The pole pitch is 20mm) 900mT (The pole pitch is 30mm) 800mT (The pole pitch is 40mm) 600mT (The pole pitch is 50mm)
	Uniform area: 1%	Minimum resolution: 0.1Gs
	Optional magnetic environment	The electromagnet of relevant magnetic size can be customized according to the needs of customers
Electrical parameters	Current source	50.00nA- 50.00mA
	Current source resolution	0.0001uA
	Measuring voltage	0 ~ ±3V
	Voltage measurement resolution	0.0001 mV
Other Accessories	Shading	Extern ally installed light-shielding parts make the test material more stable
	Sample size	normal 10mm * 10mm Maximum 16mm * 16mm
	Box cabinet	6006001000mm
	Test piece	Hall effect of Institute of Semiconductors, Chinese Academy of Sciences Standard test samples and data: 1 set (Si, Ge, GaAs, lnSb)
	Making ohmic contacts	Electric soldering iron, indium chip, solder, enameled wire, etc.
One-button automatic measurement can be performed without the need for human operation after the test is started
The software can perform I-V curve and BV curve
Set in software for automatic temperature measurement
The experimental results are measured, and the data will be temporarily saved in the software. If long-term storage is required, the data can be exported to an EXCEL table to facilitate later data processing.
Provide the Hall effect standard test samples and data of the Institute of Semiconductors, Chinese Academy of Sciences: 1 set

Testable samples of the hall effect measurement:

Testable samples of HEMS

High And Low Temperature Selection of the Hall Effect Measurement Equipment

System model	Test temperature zone	System Test Index
DX-100 High and Low Temperature Hall Effect Test System	80K ~ 500K (high and low temperature, temperature adjustment 0.1K)	Minimum resolution: 0.1GS Sample current: 0.05uA～50mA (adjust 0.1nA) Magnetic field: 2T at 10mm spacing; 1T at 30mm spacing Resistivity range: 10-5～107 Ohmcm Carrier concentration: 103～1023cm-3 Mobility: 0.1～108cm2/voltsec Resistance range: 10m Ohms～6MOhms
DX-100H High-Temperature Hall Effect Test System	300K ～ 500K (high temperature, temperature adjustment 0.1K)
DX-100L Low-Temperature Hall Effect Test System	80K ～ 300K (low temperature, temperature adjustment 0.1K)
DX-200L Low-Temperature Hall Effect Test System	4K ～ 300K (low temperature, temperature adjustment 0.1K)
DX-500 High and Low Temperature Hall Effect Test System	80K ~ 800K (high and low temperature, temperature adjustment 0.1K)
DX-500H High-Temperature Hall Effect Test System	300 K ~ 800 K (high temperature, temperature adjustment 0.1K)

Deliver, shipping and serving

We offer shipping via maritime, aerial, and express delivery channels. Our shipping solutions accommodate various needs, enabling customers to select the most suitable option according to their specific demands. Our goal is to fulfill their expectations by delivering cost-efficiently and promptly.

Alongside our diverse shipping services, we place significant emphasis on delivering exceptional customer service. Our dedicated team remains readily available to offer timely and pertinent updates regarding your shipment, ensuring you stay informed throughout the entire process.

FAQ

Q: What is the temperature range supported by the Hall Effect testing system?

A: The Hall Effect testing system typically supports a temperature range from room temperature to several hundred degrees Celsius, depending on the system's design and specifications, the temperature range of DX-100 HMES is 80-500K.

Q: How many samples can the system test simultaneously?

A: The number of samples that can be tested simultaneously depends on the system's configuration and the design of the sample holder. Generally, the system can test multiple samples at once, typically ranging from 4 to 8.

Q: Can the system perform Hall Effect testing at different temperatures?

A: Yes, high and low-temperature Hall Effect testing systems usually have temperature control capabilities, allowing testing to be conducted at various temperature conditions, ranging from room temperature to high or low temperatures.

Q: How is the accuracy and repeatability of the test results ensured?

A: The accuracy and repeatability of test results depend on the system's precision, calibration, and the operator's skill level. The system typically undergoes meticulous calibration, and the operating process must adhere to strict standard operating procedures to ensure the accuracy and repeatability of results.

Q: What is the operating procedure for the Hall Effect testing system?

A: The operating procedure typically includes sample preparation, setting up test parameters, initiating the test, recording and analyzing data, among other steps. The specific operating procedure will depend on the system's design and software functionalities, usually detailed in the user manual or operation guide.

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