Hall Effect System

Hall Effect System

DX-50 Hall Effect Measurement System (HEMS)
1. Standard Electromagnet Magnetic Field
2. Measurement of Carrier Concentration, Mobility, Resistivity, Hall Coefficient, etc. for Semiconductor Materials
3. Long Service Life, Resistant to Damage
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Description
Product introduction 

 

The DX-50 Hall Effect System is a lab-grade solution designed for precise characterization of semiconductor materials. Built with a variable electromagnet and a dedicated DX-320 sourcemeter, it enables fast, accurate measurement of carrier concentration, mobility, resistivity, Hall coefficient, and more. Its automated software simplifies testing and data export, making it ideal for universities, R&D centers, and semiconductor labs. Compatible with materials such as graphene, InP, GaN, and SiC, this system supports both low and high-resistance samples. Designed for long-term use and reliability, it meets the demanding needs of advanced material research.

 

The DX-50 Hall Effect Testing System is suitable for studying the electrical properties of semiconductor devices and semiconductor materials. Experimental results are automatically calculated by the software, allowing simultaneous determination of parameters such as bulk carrier concentration, surface carrier concentration, mobility, resistivity, Hall coefficient, magneto-resistance, and more.

 

The Hall effect system consists of an electromagnet, high-precision power supply, connecting cables, high-precision constant current source, high-precision voltmeter, gaussmeter, standard samples, sample mounting bracket, and system software.

 

DX-320 sourcemeter

 

The DX-320 effect meter specially developed for this instrument system assembles a constant current source and a switch (a six-and-a-half microvoltmeter and a Hall-complex switching relay) into one. Greatly reduced the connection and operation of the experiment. The DX-320 can be used alone as a constant stream and a microvolt.

 

Parameters of Hall effect measurement system

 

Physical parameters

Carrier concentration

10³cm⁻³ - 10²³cm⁻³

Mobility

0 .1 cm²/ volt*sec - 10⁸cm²/ volt*sec

Resistivity range

10⁻⁷ Ohm*cm - 10¹² Ohm*cm

Hall voltage

1 uV - 3V

Hall coefficient

10⁻⁵ - 10²⁷cm³/ C

Testable material type

Semiconductor material

SiGe, SiC, InAs, InGaAs, InP,AlGaAs, HgCdTe and ferrite materials etc.

low resistance material

Graphene, metals, transparent oxides, weakly magnetic semiconductor materials, TMR materials, etc.

high resistance material

Semi-insulating GaAs, GaN, CdTe, etc.

Material Conductive Particles

Type P and Type N testing of materials

Magnetic field environment

Magnet Type

Variable electromagnet

Magnitude of magnetic field

1070mT (The pole pitch is 10mm)
687mT (The pole pitch is 20mm)
500mT (The pole pitch is 30mm)
378mT (The pole pitch is 40mm)
293mT (The pole pitch is 50mm)

Uniform area

1%

Optional magnetic environment

The electromagnet of relevant magnetic size can be customized according to the needs of customers

Electrical parameters

Current source

50.00nA- 50.00mA

Current source resolution

0.0001uA

Measuring voltage

0 ~ ±3V

Voltage measurement resolution

0.0001 mV

Other Accessories

Shading

Extern ally installed light-shielding parts make the test material more stable

Sample size

Maximum 30mm * 30mm

Box cabinet

600*600*1000mm

Test piece

Hall effect of Institute of Semiconductors, Chinese Academy of Sciences Standard test samples and data: 1 set
(Si, Ge, GaAs, lnSb)

Making ohmic contacts

Electric soldering iron, indium chip, solder, enameled wire, etc.

One-button automatic measurement can be performed without the need for human operation after the test is started

The software can perform I-V curve and BV curve

Set in software for automatic temperature measurement

The experimental results are measured, and the data will be temporarily saved in the software. If long-term storage is required, the data can be exported to an EXCEL table to facilitate later data processing.

Provide the Hall effect standard test samples and data of the Institute of Semiconductors, Chinese Academy of Sciences: 1 set

 

Testable samples of hall measurement system

 

Testable samples of HEMS

 

Sample Stage of DX-50 Hall Effect Measurement System

 

Sample Stage of DX-50 Hall Effect Measurement System

 

Deliver, shipping and serving

 

We support shipping by sea, air, and express delivery. Our services cater to a range of shipping needs, ensuring that our customers can choose the best option for their specific requirements. We aim to meet their expectations by providing cost-effective and timely deliveries.

 

In addition to our shipping capabilities, we also prioritize quality customer service. Our team is always ready to provide timely and relevant information about your shipment, making sure to keep you informed every step of the way.

 

Air transportaion
sea transportation
express transportation

 

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