DX1PS3 Wafer Level Automatic In-Plane Magnetic Field Probe Station Qualifies Quality Inspection

Mar 20, 2025

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DX1PS3 Wafer Level Automatic In-plane Magnetic Field Probe Station Qualifies Quality Inspection

Dexinmag has recently released the quality inspection report for its latest product, the DX1PS3 Wafer Level Automatic In-plane Magnetic Field Probe Station. Rigorous testing and evaluation have confirmed the probe station's outstanding performance.

The inspection, conducted on December 31, 2024, involved a comprehensive check of the equipment's specifications, functionality, and safety features. Key components such as the probe station host, magnet power supply, probe holder, and control computer were all found to be in compliance with set standards.

Furthermore, the magnetic field test results were impressive, with the magnetic field intensity exceeding 330 mT, homogeneity better than 1% within a diameter of 1 mm, and resolution better than 0.02 mT. The probe station also possesses the capability to measure magnetic hysteresis loops.

This innovative product is now ready to provide reliable and practical testing solutions for customers worldwide. For more information, visit the Dexinmag official website:https://www.dexinmag.com/newsinfo/1014265.html