Two-Dimensional Magnetic Field Probe Station | Precision Wafer-Level Magnetic Testing Solution
The Two-Dimensional Magnetic Field Probe Station by Xiamen Dexing Magnet Tech. Co., Ltd. is designed for high-precision in-plane and perpendicular magnetic field measurements at the wafer level. It's an advanced testing solution for researchers and engineers working on magnetic materials, thin films, multilayers, and semiconductor devices.
Built with motorized precision control and real-time magnetic feedback, this probe station ensures exceptional accuracy, stability, and flexibility for laboratory and industrial testing environments.
Key Features
✅ Dual Magnetic Field Design – Generates both in-plane and perpendicular magnetic fields simultaneously for more comprehensive testing.
✅ High Precision Measurement – Achieves field uniformity of ±1%@φ1mm and resolution better than 0.02mT.
✅ Wafer Compatibility – Supports up to 12-inch wafers, and is backward compatible with 8-inch and 6-inch chips.
✅ Multiple Probe Support – Works with up to 7 probe groups (4 microwave + 3 DC).
✅ Motorized XY Control – Precise ±12.5mm displacement with 1μm adjustment accuracy for stable positioning.
✅ Efficient Testing – Quick lift Z-axis platform reduces setup time and improves workflow efficiency.
✅ Upgradeable Design – Option to upgrade the manual Z-axis lift to motorized control for advanced automation.
✅ Flexible Stage Adjustment – Tilt fine-tuning knob ensures the sample plane stays parallel to the magnetic field.
Technical Specifications
| Parameter | Specification |
|---|---|
| Model | DX2PS |
| Magnetic Field Direction | In-plane / Perpendicular |
| Max Magnetic Field Strength | In-plane (X): >800 mT @12mm Vertical (Z): >140 mT |
| Vertical Field Component | <0.025% when in-plane field applied alone |
| Air Gap Adjustability | No |
| Max Sample Size | 40mm × 40mm |
| Magnetic Pole Gap | 40mm / 25mm / 12mm (optional) |
| Supported Probes | Up to 7 sets (3 DC + 4 microwave) |
| Stage Movement (XY) | ±12.5mm, 1μm accuracy |
| Stage Rotation (T) | ±5° |
| Microscope Type | Stereo / Monocular |
| Field Uniformity | ±1%@φ1mm |
| Field Monitoring Accuracy | <1% |
| Field Resolution | <0.02mT |
Applications
The Two-Dimensional Magnetic Field Probe Station is ideal for:
- Magnetic material research and thin-film magnetic analysis
- Semiconductor device development and microelectronic testing
- Magnetic multilayer characterization
- Wafer-level performance analysis for advanced materials
- R&D laboratories and production testing environments requiring high precision
Why Choose Dexing Magnet Tech
At Xiamen Dexing Magnet Tech. Co., Ltd., we combine advanced engineering, proven reliability, and customization flexibility.
- ODM & OEM manufacturing for global brands
- Custom configurations based on specific research needs
- Comprehensive technical support – installation, training, and after-sales service
- Worldwide distribution and export-ready logistics
We're committed to helping research institutions and companies achieve more accurate, faster, and repeatable magnetic field testing results.
FAQ
Q1: What is the maximum wafer size supported?
A: The probe station supports up to 12-inch wafers, and is also compatible with 8-inch and 6-inch chips.
Q2: How accurate is the magnetic field monitoring?
A: The magnetic field monitoring accuracy is better than 1%, with a resolution finer than 0.02mT.
Q3: Can the probe stage be upgraded?
A: Yes. The manual Z-axis lift can be upgraded to electric control for enhanced automation and efficiency.
Q4: What industries or applications is this probe station suitable for?
A: It's widely used in magnetic materials, semiconductor, and microelectronics research and production testing.
Looking for a reliable ODM partner or high-precision magnetic testing equipment?
👉 Contact Xiamen Dexing Magnet Tech. Co., Ltd. today to discuss your project requirements or request a custom Two-Dimensional Magnetic Field Probe Station quote.
📩 Email: sales@china-dexing.com
🌐 Website: www.labmagnetic.com